MOUNTAIN VIEW, Calif., April 12, 2016 /PRNewswire/ -- Based on its recent analysis of the industrial computed tomography (CT) systems market, Frost & Sullivan recognizes GE Inspection Technologies (GE) with the 2016 Global Frost & Sullivan Company of the Year Award. GE has consolidated its market and technology leadership with the launch of its v|tome|x c HS industrial CT scanner and speed|scan CT 64, which aid rapid and high-accuracy scanning in industrial production process optimization and quality control. The solutions offer a simplified and automated workflow and improved scanning speed to monitor the output of many production lines e.g. in automotive casting or for 100% inspection of extremely complex or security relevant parts such as turbine blades or additive manufactured parts in the aerospace industry. Additionally, with the recent launch of the v|tome|x m as world's first industrial microCT scanner with advanced scatter|correct technology, GE enables CT users to reach low scatter artifact quality levels never reached previously in the CT industry with excellent quality and inspection.

"With its sound technological expertise and vast experience, GE has leveraged its non-destructive testing technology by implementing its unique scatter|correct technology into CT systems that combine the high precision of a fan beam CT system with the up to 100 times increased throughput of cone beam CT inspection," said Frost & Sullivan Industry Analyst Mariano Kimbara. "Consequently, the next-generation of CT scanners from GE will be comprehensive inspection solutions that feature a high degree of flexibility for failure analysis, production and R&D."

Striving to take CT technology to the next level of data automation in the production environment, GE introduced its phoenix v|tome|x c 450 HS industrial CT scanner and further developed its speed|scan CT 64 in 2015. The v|tome|x c HS industrial CT scanner is one of the first of its kind to support high throughput in the industrial production environment. One of the product's outstanding advantages is that it achieves low scatter radiation quality and inspection throughput through its scatter|correct and quick|pick capabilities. The quick|pick module was developed for automated blade batch examinations to generate CT scans of 25 blades within two hours without operator intervention. Meanwhile, scatter|correct provides end users with the same image quality that can be obtained from the time-consuming line detectors, while heavily streamlining the scanning process.

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